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Handbook of X-ray spectrometry : methods and techniques / edited by René E. van Grieken, Andrzej A. Markowicz
| Handbook of X-ray spectrometry : methods and techniques / edited by René E. van Grieken, Andrzej A. Markowicz |
| Autore | Grieken, Rene : van |
| Pubbl/distr/stampa | New York, NY : Marcel Dekker, c1993 |
| Descrizione fisica | xiv, 704 p. : ill. ; 26 cm. |
| Altri autori (Persone) | Markowicz, Andrzej |
| Collana | Practical spectroscopy series ; 14 |
| Soggetto topico | X-ray spectroscopy |
| ISBN | 0824784839 |
| Classificazione |
53.0.692
53.8.8 543.08586 QD96.X2 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991000989959707536 |
Grieken, Rene : van
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| New York, NY : Marcel Dekker, c1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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X-ray spectrometry [[electronic resource] ] : recent technological advances / / edited by Kouichi Tsuji, Jasna Injuk, René Van Grieken
| X-ray spectrometry [[electronic resource] ] : recent technological advances / / edited by Kouichi Tsuji, Jasna Injuk, René Van Grieken |
| Pubbl/distr/stampa | Chichester, West Sussex, England ; ; Hoboken, NJ, USA, : Wiley, c2004 |
| Descrizione fisica | 1 online resource (617 p.) |
| Disciplina |
543.08586
543.62 543/.62 |
| Altri autori (Persone) |
TsujiKouichi
InjukJasna GriekenR. van (René) |
| Soggetto topico | X-ray spectroscopy |
| ISBN |
1-280-23888-7
9786610238880 0-470-02042-3 0-470-02043-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-Ray Spectrometry: Recent Technological Advances; Contents; Contributors; Preface; 1 Introduction; 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume; 2 X-Ray Sources; 2.1 Micro X-ray Sources; 2.2 New Synchrotron Radiation Sources; 2.3 Laser-driven X-ray Sources; 3 X-Ray Optics; 3.1 Multilayers for Soft and Hard X-rays; 3.2 Single Capillaries X-ray Optics; 3.3 Polycapillary X-ray Optics; 3.4 Parabolic Compound Refractive X-ray Lenses; 4 X-Ray Detectors; 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy
4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry4.3 Superconducting Tunnel Junctions; 4.4 Cryogenic Microcalorimeters; 4.5 Position Sensitive Semiconductor Strip Detectors; 5 Special Configurations; 5.1 Grazing-incidence X-ray Spectrometry; 5.2 Grazing-exit X-ray Spectrometry; 5.3 Portable Equipment for X-ray Fluorescence Analysis; 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis; 5.5 High-energy X-ray Fluorescence; 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy 5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy5.8 X-Ray Absorption Techniques; 6 New Computerisation Methods; 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy; 6.2 Spectrum Evaluation; 7 New Applications; 7.1 X-Ray Fluorescence Analysis in Medical Sciences; 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films; 7.3 X-Ray Spectrometry in Archaeometry; 7.4 X-Ray Spectrometry in Forensic Research; 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry Index |
| Record Nr. | UNINA-9910830201903321 |
| Chichester, West Sussex, England ; ; Hoboken, NJ, USA, : Wiley, c2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray spectrometry [[electronic resource] ] : recent technological advances / / edited by Kouichi Tsuji, Jasna Injuk, René Van Grieken
| X-ray spectrometry [[electronic resource] ] : recent technological advances / / edited by Kouichi Tsuji, Jasna Injuk, René Van Grieken |
| Pubbl/distr/stampa | Chichester, West Sussex, England ; ; Hoboken, NJ, USA, : Wiley, c2004 |
| Descrizione fisica | 1 online resource (617 p.) |
| Disciplina |
543.08586
543.62 543/.62 |
| Altri autori (Persone) |
TsujiKouichi
InjukJasna GriekenR. van (René) |
| Soggetto topico | X-ray spectroscopy |
| ISBN |
1-280-23888-7
9786610238880 0-470-02042-3 0-470-02043-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-Ray Spectrometry: Recent Technological Advances; Contents; Contributors; Preface; 1 Introduction; 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume; 2 X-Ray Sources; 2.1 Micro X-ray Sources; 2.2 New Synchrotron Radiation Sources; 2.3 Laser-driven X-ray Sources; 3 X-Ray Optics; 3.1 Multilayers for Soft and Hard X-rays; 3.2 Single Capillaries X-ray Optics; 3.3 Polycapillary X-ray Optics; 3.4 Parabolic Compound Refractive X-ray Lenses; 4 X-Ray Detectors; 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy
4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry4.3 Superconducting Tunnel Junctions; 4.4 Cryogenic Microcalorimeters; 4.5 Position Sensitive Semiconductor Strip Detectors; 5 Special Configurations; 5.1 Grazing-incidence X-ray Spectrometry; 5.2 Grazing-exit X-ray Spectrometry; 5.3 Portable Equipment for X-ray Fluorescence Analysis; 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis; 5.5 High-energy X-ray Fluorescence; 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy 5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy5.8 X-Ray Absorption Techniques; 6 New Computerisation Methods; 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy; 6.2 Spectrum Evaluation; 7 New Applications; 7.1 X-Ray Fluorescence Analysis in Medical Sciences; 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films; 7.3 X-Ray Spectrometry in Archaeometry; 7.4 X-Ray Spectrometry in Forensic Research; 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry Index |
| Record Nr. | UNINA-9910840604203321 |
| Chichester, West Sussex, England ; ; Hoboken, NJ, USA, : Wiley, c2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||